Professional services by EMTERC
We have an extensive range of experimental facilities and staff expertise and can offer your organisation a fast and efficient analysis service and advice in the following areas:
Surface Analysis:
We can provide analysis of surface morphology and electrical or magnetic properties of either prepared samples or real devices (virgin or post use) supported by use of our Park AFM/SPM. Characterisation can also take place using our Profilometry, Ellipsometry and Transmission Electron Microcope facilities
Thin Films:
We have extensive clean room facilities for back-end processing, including PECVD/RIE systems, RF/DC magnetron sputtering, thermal evaporators, dip/spin coating equipment and a Langmuir Blodgett trough for molecular layer deposition., and can also provide high quality materials deposited onto a substrate of your choice. Materials covered include metals, semiconductors/insulators and conducting ITO.
Electrical Characteristation:
We have extensive high customised measurement facilities for current-voltage and capacitance-voltage measurements of thin film and wafer level packaged devices with high temperature capabilities. Existing setups include facilities for solar cell, memory and high power (dymanic and static) characteristaion, and these setups are supported by a number of 8 inch probe stations allowing femto ampere accuracy and high temperature operation (uo to 450ºC).
Process and Device Modelling:
A wealth of expertise is provided in electrical and electro-thermal device an dprocess modelling, including silicon and III-V technologies, supported by a high performance server network with a Synopsis Sentaurus TCAD modelling environment.
If you require any further information, you can download brochures giving a synopsis of EMTERC or an outline of the expert facilities located within EMTERC.